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Scanning probe microscopy (SPM)
VEECO Dimension 3100
The Dimension 3100 Nanoman AFM from Veeco provides a variety of high resolution surface imagin techniques:- Atomic force microscopy, in tapping and contact mode
- Conducting atomic force microscopy (C-SFM)
- Scanning tunneling microscopy (STM)
- Nanoindentation software and manipulation
- Magnetic force microscopy (MFM)
- Electrostatic force microscopy (EFM)
- Kelvin probe or surface potential microscopy (KPM)
The sample stage will allow large samples sizes (up to a 6 inch wafer) with a scan size up to 90µm in the X & Y and 6µm in the Z.
VEECO Multimode
- Contact mode (air/liquid)
- Tapping mode (air/liquid)
- Heating controller. Measurements in the temperature range of ambient to 250ºC
- Scan size up to 12µm in the X-Y plain, and a Z range up to 5µm
- Samples up to 15mm in diameter having a maximum thickness of 6mm.
