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Spectroscopic reflectometer
Manufacturer: MicroPack
Model: NanoCalc-UV-Vis-NIR

Equipment for measuring the thickness of transparent thin-film layers (10 nm-40 mm, with a resolution of 0.1 nm) by projecting white light through an optical fiber and observing its reflection through a spectrometer. Up to 4 stacked layers and non-contact surface profilometries can be measured with nanometer resolution.


The UPC offers the services performance that the equipment could carry out.

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Scientific and Technical Services at the UPC
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