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Spectroscopic reflectometer
Manufacturer: MicroPack
Model: NanoCalc-UV-Vis-NIR

Equipment for measuring the thickness of transparent thin-film layers (10 nm-40 mm, with a resolution of 0.1 nm) by projecting white light through an optical fiber and observing its reflection through a spectrometer. Up to 4 stacked layers and non-contact surface profilometries can be measured with nanometer resolution.

The UPC offers the services performance that the equipment could carry out.

Information and use

Scientific and Technical Services at the UPC
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