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Scanning electron microscopy (SEM)
Manufacturer: JEOL
Model: JSM 6400

Equipment for the characterization and observation of solid samples using images obtained with secondary and backscattered electrons (photography and Z-contrast). It has an RX energy dispersive spectrometer that enables the semiquantitative chemical analysis of samples.


The UPC offers the services performance that the equipment could carry out.

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Scientific and Technical Services at the UPC
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