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Scanning electron microscopy (SEM)
Manufacturer: JEOL
Model: JSM 6400

Equipment for the characterization and observation of solid samples using images obtained with secondary and backscattered electrons (photography and Z-contrast). It has an RX energy dispersive spectrometer that enables the semiquantitative chemical analysis of samples.

The UPC offers the services performance that the equipment could carry out.

Information and use

Scientific and Technical Services at the UPC
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