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Scanning transmission electron microscope (STEM)
Manufacturer: JEOL
Model: 1200 EX-II

Equipment for observation and characterization of materials using a unit for scanning and transmission through electron diffraction and microdiffraction, with acceleration from 10 KV to 120 KV. It has an RX energy dispersion spectrometer for quantitative and qualitative chemical analysis, simultaneous surface distribution of chemical elements (up to 32), and chemical analysis of linear profiles. 


The UPC offers the services performance that the equipment could carry out.

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