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Atomic force microscope (FMA)
Manufacturer: Veeco
Model: Multimode

Equipment for characterization of surface topography in three dimensions. This topographical characterization can be performed with or without contact and the result has a nanoscale quality. The equipment has accessories that allow measurement of various properties such as electrical and magnetic. Also, this equipment can perform topographical characterizations up in liquid habitats. Range: up 20μmx20μm (5x5 recommended). Resolution: depending on the conditions ... Details of accessories: cell fluids, magnetic measurements (MFM).

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