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Focused ion beam microscope
Manufacturer: Zeiss
Model: Neon 40

Equipment that consists of a microscope of focused ion beam with dual column of ion and electron for observation of solid samples. The equipment offers the possibility of selective cutting, deposition of layers, three-dimensional tomography, elemental analysis and quantification of crystal orientation. The equipment allows sample preparation for transmission electron microscopy "TEM and micro samples. The equipment allows the analysis of samples of 50x50 mm.

The UPC offers the services performance that the equipment could carry out.

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