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Scanning electron microscope (SEM)
Manufacturer: JEOL
Model: JSM-5600

Equipment for conducting solid samples characterization and monitoring by mean of images obtained with primary, secondary and backscattered electron. Includes an RX energy dispersive spectrometer which allows semi-quantitative chemical analysis of samples. Sputtering complement available, for gold thin layers deposition, to provide a conductive surface on study samples.


The UPC offers the services performance that the equipment could carry out.

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