Results 1 - 37 of 37
Atomic force microscope (FMA)
Equipment for characterization of surface topography in three dimensions. This topographical characterization can be performed with or without contact ...
CCT-TTT diagrams elaboration
Service for transformation curves performance of transformation curves in metallic materials subjected to thermal treatments, both continuous cooling (Continuous ...
Confocal and interferometric profilometer
A dual system that combines confocal and interferometric techniques. It is suitable for obtaining a rapid geometric evaluation of technical surfaces in ...
Confocal laser microscope
A laser microscope for observing and measuring samples with or without prior moderate preparation, with a magnification of up to 5000x. It can be used ...
Equipment for making non-contact surface profile measurements with a resolution of a few nanometers. The vertical resolution is 1 nm to 100 nm and it can ...
Equipment that can easily identify measurement characteristics using images taken in advance. It can also analyze fine step heights, surface micro-roughness ...
Field emission scanning electron microscope (FESEM)
Equipment that allows the observation and characterization of materials using high-resolution RX energy dispersive spectrometry. It offers quantitative ...
Focused ion beam microscope
Equipment that consists of a microscope of focused ion beam with dual column of ion and electron for observation of solid samples. The equipment offers ...
Gold, carbon and gold-palladium sputter coater
Equipment that enables the deposition of thin uniform conductive layers through target ionization for observation and study using electron microscopy.
High magnification optical microscope
Equipment for the observation of solid samples with a magnification of up to 500x, without prior preparation. It exports images in the most common digital ...
High magnification optical microscope
Equipment for the observation of metallographic preparations with a magnification of up to 500x. It exports images in the most common digital formats.
Device consisting of a high current potentiostat or galvanostat for carrying out accelerated corrosion tests by using electrochemical impedance spectroscopy. ...
Infrared spectrophotometer (FTIR)
Equipment used for identifying functional groups of organic materials, paints and certain structures of solid and liquid samples by Fourier transform infrared ...
IR spectrophotometer with ATR/ATR infrared spectrophotometer
Equipment for measuring infrared spectroscopy transmission of solid materials and paints. The maximum resolution is 0.9 cm -1 and the S/N is 22,000:1.
Isomet precision cutter
Equipment used for precision cutting at low speeds, suitable for any type of sample.
Laser optical interferometer
Equipment for the realization out three-dimensional topographic measurements, without contact with nanometer resolution. The measured field of view is ...
Metallic materials heat treatments
Mass heat treatment design, study and implementation service, for metallic materials, both under continuous cooling and thermal treatments and/or thermomechanical.
Metallographic optical microscope, high resolution polarized light, for sample observation up to 1000 magnification. Equipped with image analysis software ...
Equipment for observing solid samples by transmission, reflectance or fluorescence. It has an image capturing system and NIS-Elements BR software.
the observation, study solid samples , , magnification. camera for further analysis. of textile products.
Equipment for microscopic surface characterization of solid samples up to 230X magnification. Complemented with a stereomicroscope with a built digital ...
Equipment for observing solid samples with a magnification of up to 60x and without any preparation.
Polarizing optical microscope
Equipment used for morphological and phase transition observation of polymer materials. It has a Linkam heat plate and image analysis accessories.
An instrument equipped with an integrated dual light source (closed loop spectroscopic reflectometer) for measuring profiles with confocal and interferometric ...
PTT building diagrams (Precipitation-Temperature-Time)
Service for precipitation-temperature-time (PTT) construction of curves by performing stress relaxation tests on subjected heat treatment materials.
Scanning electron microscope (SEM)
Equipment for conducting solid samples characterization and monitoring by mean of images obtained with primary, secondary and backscattered electron. Includes ...
Scanning electron microscopy (SEM)
Equipment for the characterization and observation of solid samples using images obtained with secondary and backscattered electrons (photography and Z-contrast). ...
Scanning Electron Microscopy (SEM)
The scanning electron microscope is based on the interaction between an electron beam and the surface of a given solid material. The result is a high-resolution ...
Scanning transmission electron microscope (STEM)
Equipment for observation and characterization of materials using a unit for scanning and transmission through electron diffraction and microdiffraction, ...
Equipment for measuring the thickness of transparent thin-film layers (10 nm-40 mm, with a resolution of 0.1 nm) by projecting white light through an optical ...
Optical microscopy equipment for observation and reflection in 3-D samples. It has a digital camera to capture Deltapix 300 micrographs and perform image ...
Optical equipment for the stereoscopic observation and analysis of components and fractographic studies.
Equipment for evaluating the amplification of cellular structures such as DNA through temperature cycles (up to 97 °C). See the specifications in the ...
Thin foil electropolishing
Equipment consisting of a cell for the electropolishing and thinning of thin metal and ceramics foils of between 200 μm and 300 μm for subsequent observation ...
Transmission electron microscope (TEM)
Equipment for solid polymer samples structure and morphology observation, characterization and study, by means of electron diffraction, in order to relate ...
Transmission electron microscopy (TEM)
Equipment for the observation and characterization of solid samples using the visualization provided by an electron beam. Samples must be put into sufficiently ...
Double beam spectrophotometer with variable spectral bands (between 0.5 and 4 nm) and wavelengths between 190 nm and 1100 nm. It is fully automated and ...